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本文用蒙特卡罗方法模拟了133Xe、133mXe和135Xe在薄型NaI晶体中的沉积,并模拟计算了信噪比,以分析40K、U系和Th系核素以及137Cs在Xe测量能窗中造成的噪声影响。结果表明,信噪比的变化与射线能量相关;133Xe在晶体厚度为2cm时信噪比最低,133mXe在晶体厚度1~4cm时信噪较低且随晶体厚度的变化不明显,135Xe在晶体厚度0.2~5cm时信噪比没有极值且随着晶体厚度的增加而增加。
Abstract：The energy deposition in a thin NaI crystal caused by 133Xe,133mXe,135 Xe are simulated with Monte Carlo method.The signal-to-noise ratio(SNR) is calculated to analyze the influences of Uranium series,Thorium series and 40K as noise signal.As results,the variation of SNR is related to the energy of γ-ray.The SNRs of 133Xe have the minimum value at the 2cm thickness.The SNRs of 133mXe are smaller and have no obvious changes at the 1cm to 4cm thickness.The SNRs of 135Xe have no extremums and increase along with the increase of crystal thickness at the 0.2cm to 5cm thickness.
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DOI：
中图分类号:TL816.2
引用信息:
[1]龙斌,赵军.薄型NaI(Tl)探测器信噪比的蒙特卡罗模拟[J].核电子学与探测技术,2008,No.161(02):430-433+439.
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